A novel Silicon Carbide gate-controlled bipolar field effect composite transistor with polysilicon region (SiC GCBTP) is proposed. Different from the traditional electrode connection mode of SiC VDMOS, the P+ region of P-well is connected with the gate in SiC GCBTP, and the polysilicon region is added between the P+ region and the gate. By this method, additional minority carriers can be injected into the drift region in on-state, and the distribution of minority carriers in the drift region will be optimized, so the on-state current is increased. In terms of static characteristics, it has the same high breakdown voltage (811V) as SiC VDMOS which length of drift is 5.5 μm. The on-state current of SiC GCBTP is 2.47×10-3 A/μm (V
G=10V, V
D=10V) which is 5.7 times that of SiC IGBT and 36.4 times that of SiC VDMOS. In terms of dynamic characteristics, the turn-on time of SiC GCBTP is only 0.425ns. And the turn-off time of SiC GCBTP is similar to SIC IGBT, which is 114.72ns.
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