Ultrathin PbI2 single crystals for high sensitivity flexible photodetectors can be directly grown by virtue of their layered crystal structure.

Using lattice matched ZnO substrates, wurtzite single crystalline Mg0.49Zn0.51O films were obtained by reactive magnetron cosputtering method, and the heterostructures of MgZnO/ZnO were fabricated into metal-semiconductor-metal solar-blind photodetectors (SBPDs). Calculated and experimental results demonstrate that the response of the ZnO substrate can be suppressed by adopting a thick MgZnO epilayer. The SBPD with a 2 μm thick MgZnO epilayer shows a peak responsivity of 304 mA/W at 260 nm under 10 V bias, which is comparable to the highest value ever reported in MgZnO-based SBPDs. A rejection ratio (R260 nm/R365 nm) over 5×102 is also observed, indicating fully suppression of the signal from ZnO substrate.

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