Auger processes involving the filling of holes in the valence band are thought to make important contributions to the low-energy photoelectron and secondary electron spectrum from many solids. However, measurements of the energy spectrum and the efficiency with which electrons are emitted in this process remain elusive due to a large unrelated background resulting from primary beam-induced secondary electrons. Here, we report the direct measurement of the energy spectra of electrons emitted from single layer graphene as a result of the decay of deep holes in the valence band. These measurements were made possible by eliminating competing backgrounds by employing low-energy positrons (<1.25 eV) to create valence-band holes by annihilation. Our experimental results, supported by theoretical calculations, indicate that between 80 and 100% of the deep valence-band holes in graphene are filled via an Auger transition.

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We describe a novel spectrometer designed for positron annihilation induced Auger electron spectroscopy employing a time-of-flight spectrometer. The spectrometer's new configuration enables us to implant monoenergetic positrons with kinetic energies as low as 1.5 eV on the sample while simultaneously allowing for the detection of electrons emitted from the sample surface at kinetic energies ranging from ∼500 eV to 0 eV. The spectrometer's unique characteristics made it possible to perform (a) first experiments demonstrating the direct transition of a positron from an unbound scattering state to a bound surface state and (b) the first experiments demonstrating that Auger electron spectra can be obtained down to 0 eV without the beam induced secondary electron background obscuring the low energy part of the spectra. Data are presented which show alternative means of estimating positron surface state binding energy and background-free Auger spectra.

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Topological insulators are attracting considerable interest due to their potential for technological applications and as platforms for exploring wide-ranging fundamental science questions. In order to exploit, fine-tune, control and manipulate the topological surface states, spectroscopic tools which can effectively probe their properties are of key importance. Here, we demonstrate that positrons provide a sensitive probe for topological states, and that the associated annihilation spectrum provides a new technique for characterizing these states. Firm experimental evidence for the existence of a positron surface state near Bi2Te2Se with a binding energy of E b = 2.7 ± 0.2 eV is presented, and is confirmed by first-principles calculations. Additionally, the simulations predict a significant signal originating from annihilation with the topological surface states and shows the feasibility to detect their spin-texture through the use of spin-polarized positron beams.

Positron-annihilation-induced Auger electron spectroscopy (PAES) was used to obtain Cu and Au Auger spectra that are free of primary-beam-induced backgrounds by impinging the positrons at an energy below the secondary-electron-emission threshold. The removal of the core electron via annihilation in the PAES process resulted in the elimination of post-collision effects. The spectra indicate that there is an intense low-energy tail (LET) associated with the Auger peak that extends all the way to 0 eV. The LET is interpreted as indicative of processes in which filling of the core hole by a valence electron results in the ejection of two or more valence electrons which share the energy of the conventional CVV Auger electron.

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Auger Photoelectron Coincidence Spectroscopy (APECS), in which the Auger spectra is measured in coincidence with the core level photoelectron, is capable of pulling difficult to observe low energy Auger peaks out of a large background due mostly to inelastically scattered valence band (VB) photoelectrons. However the APECS method alone cannot eliminate the background due to valence band photoemission processes in which the initial photon energy is shared by two or more electrons and one of the electrons is in the energy range of the core level photoemission peak. Here we describe an experimental method to determine the contributions from these background processes and apply this method in the case of Copper M 3 VV Auger spectrum obtained in coincidence with the 3p 3/2 photoemission peak. A beam of 200 eV photons was incident on a Cu(100) sample and a series of coincidence measurements were performed using a spectrometer equipped with two cylindrical mirror analyzers (CMAs). One CMA was set at series of fixed energies that ranged between the energy of the core and the VB peaks. The other CMA was scanned over a range corresponding to electrons leaving the surface between 0eV and 70eV. The set of measured spectra were then fit to a parameterized function which was extrapolated to determine the background in the APECS spectra due to multi-electron and inelastic VB photoemission processes. The extrapolated background was subtracted from the APECS spectrum to obtain the spectrum of electrons emitted solely as the result of the Auger process. A comparison of the coincidence spectrum with the same spectrum with background removed shows that in the case of Cu M 3 VV the background due to the inelastic scattering of VB electrons is negligible in the region of the Auger peak but is more than half the total signal down in the low energy tail of the Auger peak.