The distribution of yttrium and lanthanum dopants hason the dopant level, Al 2 O 3 grain size, and impurity content of Al 2 O 3 . been mapped in yttrium-and lanthanum-doped polycrystalline aluminas using imaging secondary-ion mass spec-The objective of this work was to map the yttrium distribution in a 1000-ppm-yttrium-doped polycrystalline Al 2 O 3 samtrometry (imaging-SIMS). Both dopants segregate to grain boundaries and pore surfaces. On average, yttrium occupies ple that has exhibited favorable creep properties. 1 In addition, a 500-ppm-lanthanum-doped sample was examined, primarily to 7.1%-9.0% of the available grain-boundary cation sites, whereas lanthanum occupies only 2.0%-5.2%. In 1000-compare the segregation behavior of the two isovalent rareearth elements and partly to assess the potential of lanthanumppm-yttrium-doped alumina, an abundance of yttrium aluminum garnet precipitates also is observed. Implications of doped Al 2 O 3 for improved creep properties. Mapping of the dopant distributions was performed using these observations to the creep behavior of alumina are discussed. The similarity in the segregation behavior of yttrium a high-resolution scanning-ion microprobe developed at the University of Chicago. 17 This unique instrument uses a finely and lanthanum highlights the potential of lanthanum-doped alumina for improved creep properties.focused gallium beam to sputter secondary ions from the uppermost layers of the sample surface. For many elements, this imaging-SIMS system offers excellent analytical sensitivity,
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