In order to diagnose ventricular dysfunction based on the acoustic characteristics of the heart muscle of the ventricle, it is necessary to detect vibration signals from various parts of the ventricular wall. This is, however, difficult using previously proposed ultrasonic diagnostic methods or systems. The reason is that the amplitude of the cardiac motion is large during one beat period which produces large fluctuations in the transit time required for ultrasonic waves to travel from the transducer to the heart and back. This paper proposes a new method for overcoming this problem and accurately measuring small vibrations of the ventricle wall using ultrasound. In this method, the demodulated ultrasound signal reflected at the heart wall is converted from analogue to digital (A/D) signal at a high sampling frequency; from the resultant digital signal, the velocity of the wall is accurately obtained over a wide dynamic range based on the Doppler effect. The proposed method is preliminarily applied to the detection of small vibrations on the aortic wall and the interventricular septum. The new method offers potential for research in acoustical diagnosis of heart and artery dysfunction.
The surface of positive photoresist is hardened by the ion implantation process and becomes very difficult to remove thereafter. To investigate this phenomenon, the following aspects of photoresist were investigated: (i) the effectiveness of low-energy plasma ashing, (if) surface states by XPS, and (iii) outgassing during the ion implantation process. For photoresists without ion implantation, the ion bombardment energy dependence of the ashing rate was found to have two regions: the radical-mode ashing region and the reactive ion etching (RIE) mode ashing region. On the other hand, photoresist following an ion implantation process was found to be entirely covered with a hardened surface layer exhibiting only RIE-mode characteristics. This is why a plasma ashing process with low ion bombardment energy for suppression of damage on the wafer surface cannot work effectively in this case. When the photoresist is baked at a high temperature in a nitrogen ambience, the ratio between the carbon (C1~) peak area and the oxygen (O1,) peak area (C/O ratio) in the x-ray photoelectron spectroscopy data increases, indicating that carbonization has occurred. The ericial C/O ratio of carbonized photoresist that can be removed by sulfuric acid/hydrogen peroxide mix (SPM) is i0. However, an ion-implanted photoresist, with a C/O ratio of three, cannot be removed by SPM. Outgassing from the photoresist during the ion implantation process contains hydrogen as its main component. Our results indicate that an ion-implanted photoresist is difficult to remove because of an inactive high-polymer layer formed on the surface which has an extremely low hydrogen concentration, not because of carbonization in the surface. Therefore, the hydrogen concentration in the photoresist surface is considered to be critical to the efficiency of photoresist ashing. Since outgassing from photoresist during the ion implantation process contains hydrogen as its main component, the hardened surface layer must be supplied with hydrogen compounds in order to effectively remove the ion-implanted photoresist without damaging the substrate.
The hydrodechlorination of chloromethanes over Pd/SiO2 gave higher hydrocarbons selectively. The produced hydrocarbons followed well the Schulz-Flory distribution, indicating that the hydrocarbons were formed via polymerization of surface C1 species. The probability of chain-growth was increased in the order of the reactivity of chloromethane, that is, CH2Cl2
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