A 2D quasicrystal with an eightfold rotational axis has been found in rapidly solidified V-Ni-Si and Cr-Ni-Si alloys by means of transmission electron microscopy. The electron-diff'raction pattern taken along this axis shows no periodicity but a clear eightfold The alloy films used in this investigation were prepared first by melting pure metals and silicon in an Ar arc furnace followed by remelting and rapid solidification (about 10 deg/sec) by the piston-and-anvil method. The foils suitable for transmission electron microscopy were prepared from these films by electrolytical thinning in 5% HC104 in ethanol at -30'C followed by a brief ion thinning. They were examined in a Philips EM420 Fig. 3(a)].

No abstract

No abstract

No abstract