A correlation between the growth process and electrical properties of [Ni80Fe20(2 nm)/ Au(2 nm)/Co(0.8 nm)/Au(2 nm)]15 multilayers is presented. A set of multilayers of identical composition was deposited in different temperatures. The changes in giant magnetoresistance amplitude were correlated with the changes in Co layers growth process that occur in different temperatures. The in situ conductance measurement leads to the growth mechanism identification in high temperatures as formation of Co islands. Intensified islandisation of Co was eventually confirmed by the temperature changes in shape of the Hall voltage loops, and the evolution of Co layers contribution.
An advanced deposition technique known as glancing angle deposition was used to fabricate randomly seeded magnetic cobalt columnar nanostructures. The existence of nanocolumns was conrmed by the cross-section scanning electron microscopy. The evolution in the magnetization reversal mechanism as a function of the lm thickness was investigated. The coercivity HC and MR/MS ratio (where MR and MS denote the remanent and saturation magnetization, respectively), derived from the magnetic hysteresis loops, are discussed as a function of the angle between the external magnetic eld and the surface normal. The direction of the magnetization easy/ hard axis and the columns inclination angle were determined on the basis of the angular dependences of the HC and the MR/MS. A crossover from the coherent rotation, based on the StonerWohlfarth model, to the curling reversal mode was observed.
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