While the discovery of two-dimensional (2D) magnets opens the door for fundamental physics and next-generation spintronics, it is technically challenging to achieve the room-temperature ferromagnetic (FM) order in a way compatible with potential device applications. Here, we report the growth and properties of single- and few-layer CrTe2, a van der Waals (vdW) material, on bilayer graphene by molecular beam epitaxy (MBE). Intrinsic ferromagnetism with a Curie temperature (TC) up to 300 K, an atomic magnetic moment of ~0.21 $${\mu }_{{\rm{B}}}$$
μ
B
/Cr and perpendicular magnetic anisotropy (PMA) constant (Ku) of 4.89 × 105 erg/cm3 at room temperature in these few-monolayer films have been unambiguously evidenced by superconducting quantum interference device and X-ray magnetic circular dichroism. This intrinsic ferromagnetism has also been identified by the splitting of majority and minority band dispersions with ~0.2 eV at Г point using angle-resolved photoemission spectroscopy. The FM order is preserved with the film thickness down to a monolayer (TC ~ 200 K), benefiting from the strong PMA and weak interlayer coupling. The successful MBE growth of 2D FM CrTe2 films with room-temperature ferromagnetism opens a new avenue for developing large-scale 2D magnet-based spintronics devices.
We present a method to quantify the spin Hall angle (SHA) with spin pumping and microwave photoresistance measurements. With this method, we separate the inverse spin Hall effect (ISHE) from other unwanted effects for permalloy/Pt bilayers using out-of-plane microwave excitation.Through microwave photoresistance measurements, the in-and out-of-plane precessing angles of the magnetization are determined and enabled for the exact determination of the injected pure spin current. This method is demonstrated with an almost perfect Lorentz line-shape for the obtained ISHE signal and the frequency independent SHA value as predicted by theory. By varying the Pt thickness, the SHA and spin-diffusion length of Pt is quantified as 0.012 0.001 ± and 8.3 0.9 ± nm, respectively.
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