A techno-economic analysis of perovskite-silicon tandem solar modules is presented, outlining the most viable pathway for designing cost-effective, commercially viable tandems.
Photo-conductive AFM spectroscopy ('pcAFMs') is proposed as a high-resolution approach for investigating nanostructured photovoltaics, uniquely providing nanoscale maps of photovoltaic (PV) performance parameters such as the short circuit current, open circuit voltage, maximum power, or fill factor. The method is demonstrated with a stack of 21 images acquired during in situ illumination of micropatterned polycrystalline CdTe/CdS, providing more than 42 000 I/V curves spatially separated by~5 nm. For these CdTe/CdS microcells, the calculated photoconduction ranges from 0 to 700 picoSiemens (pS) upon illumination with~1.6 suns, depending on location and biasing conditions. Mean short circuit currents of 2 pA, maximum powers of 0.5 pW, and fill factors of 30% are determined. The mean voltage at which the detected photocurrent is zero is determined to be 0.7 V. Significantly, enhancements and reductions in these more commonly macroscopic PV performance metrics are observed to correlate with certain grains and grain boundaries, and are confirmed to be independent of topography. These results demonstrate the benefits of nanoscale resolved PV functional measurements, reiterate the importance of microstructural control down to the nanoscale for 'PV devices, and provide a widely applicable new approach for directly investigating PV materials.
The presence of atomic-scale defects at multilayer interfaces significantly
degrades performance in CdTe-based photovoltaic technologies. The ability to
accurately predict and understand defect formation mechanisms during overlayer
growth is, therefore, a rational approach for improving the efficiencies of
CdTe materials. In this work, we utilize a recently developed CdTe bond-order
potential (BOP) to enable accurate molecular dynamics (MD) simulations for
predicting defect formation during multilayer growth. A detailed comparison of
our MD simulations to high-resolution transmission electron microscopy
experiments verifies the accuracy and predictive power of our approach. Our
simulations further indicate that island growth can reduce the lattice mismatch
induced defects. These results highlight the use of predictive MD simulations
to gain new insight on defect reduction in CdTe overlayers, which directly
addresses efforts to improve these materials
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