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Multiphase drives are advantageous when high overall system reliability and the reduction in the total power per phase are required. The control strategies for these applications require a good knowledge of the machine parameters to ensure a high quality of the dynamic and steady-state drive performance. Multiphase machines are still not common in industry and it appears that very little work has been done so far in relation to parameter identification techniques. This paper presents and implements a procedure to estimate the parameters of a five-phase induction machine, which can be also extended to other multiphase machines with higher phase numbers. The method is based on standstill time-domain tests and recursive least-squares algorithms. Experimental results are provided to illustrate the developed identification method using tests on two different five-phase induction machines. Correlation with corresponding parameters obtained in Part 1 of this paper is established, where electrical parameters of the same two five-phase inverter-fed induction motor drives were identified using various procedures, based on sinusoidal excitation of the machine.

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A physical model for the simulation of x-ray emission spectra from samples irradiated with kilovolt electron beams is proposed. Inner shell ionization by electron impact is described by means of total cross sections evaluated from an optical-data model. A double differential cross section is proposed for bremsstrahlung emission, which reproduces the radiative stopping powers derived from the partial wave calculations of Kissel, Quarles and Pratt ͓At. Data Nucl. Data Tables 28, 381 ͑1983͔͒. These ionization and radiative cross sections have been introduced into a general-purpose Monte Carlo code, which performs simulation of coupled electron and photon transport for arbitrary materials. To improve the efficiency of the simulation, interaction forcing, a variance reduction technique, has been applied for both ionizing collisions and radiative events. The reliability of simulated x-ray spectra is analyzed by comparing simulation results with electron probe measurements.

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