The structure of sputtered amorphous Ge 2 Sb 2 Te 5 was investigated by high energy X-ray diffraction, neutron diffraction and Ge-, Sb-and Te K-edge EXAFS measurements. The five datasets were modelled simultaneously in the framework of the reverse Monte Carlo simulation technique. It was found that apart from Te-Sb and Te-Ge bonds existing in the crystalline phases Ge-Ge and Sb-Ge bonding is also significant in sputtered amorphous Ge 2 Sb 2 Te 5 . According to our results all components obey the '8-N' rule.
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