The probe-surface interaction underlying the ‘‘shear-force’’ distance control commonly used in near-field microscopy has been studied in detail by measuring dither resonance profiles and approach curves in vacuum and liquid helium. Simulations based on a nonlinear oscillator model considering the probe geometry, its elastic properties, adiabatic short-range probe-surface contact, and the surface tilt angle, are in excellent agreement with the experiments. We prove conclusively that a nonlinear bending force mechanism with parametric mode conversion is responsible for the observed phenomena.
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