Currently, the use of Zn(O,S) as buffer material for Cu(In,Ga)Se2 (CIGS) solar cells is intensely studied in order to further boost the performance of these devices. In this context, nondestructive analytical tools are needed that enable the determination of buffer bandgap energies in the complete device. To this end, we developed a spectroscopic approach based on electroreflectance (ER). From a set of measured angle-resolved ER (ARER) spectra, an averaged modulus spectrum is numerically calculated. This method suppresses the commonly observed detrimental line-shape distortions due to interference effects in the layered device structure and thus enables the determination of bandgap energies even for thin buffer layers. To verify the working principle of ARER, we first apply it to CIGS absorber and CdS buffer layers. Then, we utilize it to investigate CIGS solar cells with Zn(O,S) buffers. All ARER results are compared to the results of diffuse ER, a technique previously developed for the suppression of interference fringes. We demonstrate that ARER is the superior ER method for nondestructive bandgap determination of thin buffer layers in complete CIGS solar cells. Moreover, a Cu containing compound was determined as a secondary phase in the Zn(O,S) buffer by combined ARER studies, scanning transmission electron microscopy, and energy-dispersive X-ray spectroscopy.
Thin-film solar cells with Cu(In,Ga)Se2 (CIGS) absorber layers have been intensively studied due to their high power conversion efficiencies. CIGS solar cells with Zn(O,S) buffer layers achieved record efficiencies due to their reduced parasitic absorption compared with the more commonly used CdS buffer. Accordingly, we have studied solution-grown Zn(O,S) buffer layers on polycrystalline CIGS absorber layers by complementary techniques. A bandgap energy Eg of 2.9 eV is detected by means of angle-resolved electroreflectance spectroscopy corresponding to Zn(O,S), whereas an additional Eg of 2.3 eV clearly appeared for a post-annealed CIGS solar cell (250 °C in air) compared with the as-grown state. To identify the chemical phase that contributes to the Eg of 2.3 eV, the microstructure and microchemistry of the Zn(O,S) buffer layers in the as-grown state and after annealing were analyzed by different transmission electron microscopic techniques on the submicrometer scale and energy-dispersive x-ray spectroscopy. We demonstrate that the combination of these methods facilitates a comprehensive analysis of the complex phase constitution of nanoscaled buffer layers. The results show that after annealing, the Cu concentration in Zn(O,S) is increased. This observation indicates the existence of an additional Cu-containing phase with Eg close to 2.3 eV, such as Cu2Se (2.23 eV) or CuS (2.36 eV), which could be one possible origin of the low power conversion efficiency and low fill factor of the solar cell under investigation.
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