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The plasma potential of 13.56-MHz low-pressure argon glow discharges has been measured for various modes of applying the rf power in a geometrically asymmetric planar system. The plasma potential is determined from the energy distribution of positive ions incident on the grounded electrode. The voltages on the excitation electrode (target electrode) are carefully measured and the capacitive sheath approximation is used to relate these measured voltages to the measured plasma potential. This approximation is successful in most of the situations encountered in this low-pressure (20 mTorr) relatively low-power density regime. The effects of superimposing dc voltages on the excitation electrode are discussed.

With the need for high plasma density and low pressure in single wafer etching tools, a number of inductive etching systems have been and are being developed for commercial sale. This paper reviews some of the history of low-pressure inductive plasmas, gives features of inductive plasmas, limitations, corrections and presents uses for plasma processing. The theory for the skin depth, rf coil impedance and efficiency is also discussed.

A tuned, cylindrical Langmuir probe was used to measure current-voltage traces in a planar, inductive oxygen, radio frequency glow discharge at several pressures ranging from 0.5 to 10 mT. The plasma potentials were determined from the zero crossings of the trace second derivatives. Positive ion densities were evaluated using orbit motion limited probe theory; electron densities were estimated by integrating the area under the unnormalized distribution function. By applying the Druyvesteyn formula to the digitized probe traces, the electron energy distribution functions were obtained. The distribution functions ranged from Maxwellian at 0.5 mT to almost Druyvesteyn-like at 10 mT.