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Recent instrumental improvements which successfully extend the time resolution of pulsed beam electron diffraction to the picosecond regime are described. Based on modifications of an existing nanosecond apparatus, a new sample inlet system, electron pulse generation laser, and amplified detector have been incorporated into the design such that significant improvements in both the signal level and ultimate time resolution are achieved; an upper estimate of the electron pulse width is ∼20 ps. Enhancements are such that, for operation in the nanosecond time domain, an entire diffraction pattern over a useful range of scattering angles may be collected from a gas-phase sample in a single electron pulse.