Theoretical estimates indicate that graphene thin films can be used as transparent electrodes for thin-film devices such as solar cells and organic light-emitting diodes, with an unmatched combination of sheet resistance and transparency. We demonstrate organic light-emitting diodes with solution-processed graphene thin film transparent conductive anodes. The graphene electrodes were deposited on quartz substrates by spin-coating of an aqueous dispersion of functionalized graphene, followed by a vacuum anneal step to reduce the sheet resistance. Small molecular weight organic materials and a metal cathode were directly deposited on the graphene anodes, resulting in devices with a performance comparable to control devices on indium-tin-oxide transparent anodes. The outcoupling efficiency of devices on graphene and indium-tin-oxide is nearly identical, in agreement with model predictions.

We demonstrate that solution-processed graphene thin films can serve as transparent conductive anodes for organic photovoltaic cells. The graphene electrodes were deposited on quartz substrates by spin coating of an aqueous dispersion of functionalized graphene, followed by a reduction process to reduce the sheet resistance. Small molecular weight organic solar cells can be directly deposited on such graphene anodes. The short-circuit current and fill factor of these devices on graphene are lower than those of control device on indium tin oxide due to the higher sheet resistance of the graphene films. We anticipate that further optimization of the reduction conditions will improve the performance of these graphene anodes.

A giant low-frequency dielectric constant ( epsilon 0 approximately 10(5)) near room temperature was observed in Li,Ti co-doped NiO ceramics. Unlike currently best-known high epsilon 0 ferroelectric-related materials, the doped oxide is a nonperovskite, lead-free, and nonferroelectric material. It is suggested that the giant dielectric constant response of the doped NiO could be enhanced by a grain boundary-layer mechanism as found in boundary-layer capacitors. In addition, there is about a one-hundred-fold drop in the dielectric constant at low temperature. This anomaly is attributed to a thermally excited relaxation process rather than a thermally driven phase transition, as for that yielding ferroelectrics.

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