The automation and intellectualization of the manufacturing processes in the iron and steel industry needs the strong support of inspection technologies, which play an important role in the field of quality control. At present, visual inspection technology based on image processing has an absolute advantage because of its intuitive nature, convenience, and efficiency. A major breakthrough in this field can be achieved if sufficient research regarding visual inspection technologies is undertaken. Therefore, the purpose of this article is to study the latest developments in steel inspection relating to the detected object, system hardware, and system software, existing problems of current inspection technologies, and future research directions. The paper mainly focuses on the research status and trends of inspection technology. The network framework based on deep learning provides space for the development of end-to-end mode inspection technology, which would greatly promote the implementation of intelligent manufacturing.
Machine vision is one of the key technologies used to perform intelligent manufacturing. In order to improve the recognition rate of multi-class defects in wheel hubs, an improved Faster R-CNN method was proposed. A data set for wheel hub defects was built. This data set consisted of four types of defects in 2,412 1080 × 1440 pixels images. Faster R-CNN was modified, trained, verified and tested based on this database. The recognition rate for this proposed method was excellent. The proposed method was compared with the popular R-CNN and YOLOv3 methods showing simpler, faster, and more accurate defect detection, which demonstrates the superiority of the improved Faster R-CNN for wheel hub defects.
Rapid object recognition in the industrial field is the key to intelligent manufacturing. The research on fast recognition methods based on deep learning was the focus of researchers in recent years, but the balance between detection speed and accuracy was not well solved. In this paper, a fast recognition method for electronic components in a complex background is presented. Firstly, we built the image dataset, including image acquisition, image augmentation, and image labeling. Secondly, a fast recognition method based on deep learning was proposed. The balance between detection accuracy and detection speed was solved through the lightweight improvement of YOLO (You Only Look Once)-V3 network model. Finally, the experiment was completed, and the proposed method was compared with several popular detection methods. The results showed that the accuracy reached 95.21% and the speed was 0.0794 s, which proved the superiority of this method for electronic component detection.
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