Capacitor mismatch problem due to process variation causes weight error, which deteriorates the linearity of SAR ADC. In this paper, a novel calibration scheme based on genetic algorithm(GA) combined with a radix-less-than-2 SAR ADC is proposed to extract the weight error caused by capacitor mismatch. This is a foreground calibration scheme and no extra injections are added. The proposed GA-based calibration scheme is simulated based on 40 nm CMOS technology. After calibration, ENOB increases from 10.19 bits to 11.46 bits, INL changes from +2.22/−2.12 LSB to +0.81/−0.80 LSB, and DNL changes from +1.79/−1.00 LSB to +0.99/−1.00LSB. As can be seen from the simulation results, the proposed calibration scheme can effectively improve the linearity deterioration caused by capacitor mismatch.
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