Omni-directional, ultra small angle X-ray scattering imaging provides a method to measure the orientation of micro-structures without having to resolve them. In this letter, we use single-photon localization with the Timepix3 chip to demonstrate the first laboratory-based implementation of single-shot, omni-directional X-ray scattering imaging with the beam-tracking technique. The setup allows for a fast and accurate retrieval of the scattering signal using a simple absorption mask. We suggest that our new approach may enable faster laboratory-based tensor tomography and could be used for energy resolved X-ray scattering imaging, useful in mitigate scattering signal artifacts caused by polychromatic illumination.
2020The measurement of ultra small angle X-ray scattering from sub-resolution sample structures is within X-ray imaging commonly referred to as the dark-field contrast [1,2]. The dark-field contrast has potential within both non-destructive testing [3,4] and medical [5] applications as it
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Periodic two-dimensional tungsten X-ray optical gratings were fabricated using a combination of pico-second laser ablation and wet chemical etch. A 200 µm thick cold-rolled sheet of tungsten (99.97%) was used as base material for the fabrication of a 1.5 × 1.5 cm 2 periodic grating with an array of circular holes of approximately 12:1 aspect ratio. The laser parameters were optimized to obtain through-hole diameters slightly smaller than the desired final dimension. Subsequent wet etching was used to precisely control the diameter of throughholes. The through-hole profile was characterized using scanning electron microscopy (SEM) and showed a slight conical shape with a slope of 1.3%. The two-dimensional tungsten absorption grating was successfully tested in an X-ray phase-contrast imaging setup. The method has proven to have some relevant benefits, such as good reproducibility and fairly easy fabrication due to few manufacturing steps.
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