Abstract:The results of industrial application of an online X-ray fluorescence coating thickness analyzer for measuring the thickness of phosphate coatings on moving steel strips are considered in the article. The target range of coating thickness to be measured is from tens to hundreds of mg/m 2 in a measurement time of 10 s. The measurement accuracy observed during long-duration factory acceptance test was 10-15%. The coating thickness analyzer consists of two XRF gauges, mounted above and below the steel strip and capable of moving across the moving strip system for their suspension and relocation and electronic control unit. Fully automated software was developed to automatically and continuously (24/7) control both gauges, scanning both sides of the steel strip, and develop and test methods for measuring new coatings. It allows performing offline storage and retrieval of the measurement results, remotely controlling the analyzer components and measurement modes from a control room. The developed XRF coating thickness analyzer can also be used for real-time measurement of other types of coatings, both metallic and non-metallic.

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Aluminium coatings that are formed by physical vapour deposition (PVD) on rolled steel products are more resistant to atmospheric and seawater corrosion than zinc coatings. We developed a coating thickness analyzer (CTA) with an X-ray fluorescence (XRF) measuring head, that is integrated into the PVD pilot line. In this study, to conduct measurements of elements with atomic numbers less than 20 while avoiding the problem of registration of light elements, the measuring head was integrated into a process vacuum chamber to maintain a vacuum during the measurements. To validate the proposed tool, cold-rolled steel strips of different grades are used as substrates, and aluminium was deposited on the surface via PVD in thicknesses ranging from 1 to 20 g/m2. The thin-film thickness measurements during a pre-acceptance test were found to have a relative accuracy of less than 5% and a relative precision of less than 1% – 2%. The proposed CTA can be readily integrated in the factory’s automatic process control system and the real-time measurements in operating and calibration modes, and the status of all spectrometric equipment (X-ray tube, detector etc.) can be transmitted to the upper-level computer. Thus, the process engineer can properly control the deposition process.