There are two beamlines (BLs), 4C1 and 4C2, at the Pohang Accelerator Laboratory that are dedicated to small angle X-ray scattering (SAXS). The 4C1 BL was constructed in early 2000 and is open to public users, including both domestic and foreign researchers. In 2003, construction of the second SAXS BL, 4C2, was complete and commissioning and user support were started. The 4C2 BL uses the same bending magnet as its light source as the 4C1 BL. The 4C1 BL uses a synthetic double multilayer monochromator, whereas the 4C2 BL uses a Si(111) double crystal monochromator for both small angle and wide angle X-ray scattering. In the 4C2 BL, the collimating mirror is positioned behind the monochromator in order to enhance the beam flux and energy resolution. A toroidal focusing mirror is positioned in front of the monochromator to increase the beam flux and eliminate higher harmonics. The 4C2 BL also contains a digital cooled charge coupled detector, which has a wide dynamic range and good sensitivity to weak scattering, thereby making it suitable for a range of SAXS and wide angle X-ray scattering experiments. The general performance of the 4C2 BL was initially tested using standard samples and further confirmed by the experience of users during three years of operation. In addition, several grazing incidence X-ray scattering measurements were carried out at the 4C2 BL.
Back Cover: Type‐II phase like poly(3‐hexylthiophene) (P3HT) crystals are formed near the interface region of an Al electrode in a full device structure for organic photovoltaic cells by low temperature cooling to −143 °C followed by gradual heating to 30 °C. Concomitant with the formation of the type‐II phase, an 1:3 ordered P3HT type‐II (1/3,0,0) super‐lattice peak emerges in the 2D GI‐SAXS pattern. Further details can be found in the article by S. W. Lee, H.‐S. Keum, H. S. Kim, H. J. Kim,* K. Ahn, D. R. Lee,* J. H. Kim, and H. H. Lee* on page 203.
PSS) substrate subjected to cryo-cooling to low temperature (-143 °C) followed by gradual heating to 50 °C. The behavior of these systems is examined in the absence and presence of an Al electrode on top of the P3HT:PCBM film. At temperatures below -10 °C, only the type-I phase of P3HT is observed. However, the type-II phase of P3HT starts to form near -10 °C, in both the presence and absence of the Al layer. In the system without an Al layer, the type-II phase disappears at 30 °C, but this phase persists to 50 °C in the presence of the Al layer. Concomitant with the formation of the type-II phase, a 1:3 ordered P3HT type-II (1/3,0,0) superlattice peak emerged. The type-II domains tend to form near the Al electrode layer and show a higher degree of alignment than the type-I crystals.
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