To improve electric vehicle (EV) uptake, fast charging systems must be widely deployed. However, fast EV charging mission profiles expose power electronic components to extremely high-power stresses within short periods of time. Consequently, power electronic components in fast EV charging systems are expected to degrade/wear-out at a faster rate, requiring frequent replacement within the lifespan of the charging system. It is, therefore, important to both design and build fast EV charging systems with a known level of reliability. This paper proposes a model to investigate the reliability of fast EV charging systems. Using the model, the reliability of a typical fast EV charging system is analyzed, and results are presented to show how the lifetime and reliability of semiconductor switches used in fast EV charging systems can be predicted, even under widely varying mission profiles.
Fast electric vehicle charging systems (FEVCSs) are becoming popular, but to assure long-term operation, further research on battery lifetime is necessary. This is because FEVCSs use high charging currents, and consequently subject Li-Ion batteries to high levels of average state of charge (SOC) and temperatures within a short period of time. Thus, degradation mechanisms, such as Lithium plating and electrolyte breakdown, are inevitable in Li-Ion batteries, leading to reduced battery capacity and lifetime. Therefore to investigate the battery reliability of FEVCSs, this paper proposes a two-stage modeling approach. Using the proposed model, the impact of SOC and temperature on the reliability of the battery as well as the reliability of a Li-Ion battery under typical fast EV charging conditions are investigated, and results are presented to show how the battery reliability deteriorates under fast charging conditions.
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