Efficient mixed metal lead‐tin halide perovskites are essential for the development of all‐perovskite tandem solar cells, however they are currently limited by significant short‐circuit current losses despite their near optimal bandgap (≈1.25 eV). Herein, the origin of these losses is investigated, using a combination of voltage dependent photoluminescence (PL) timeseries and various charge extraction measurements. It is demonstrated that the Pb/Sn‐perovskite devices suffer from a reduction in the charge extraction efficiency within the first few seconds of operation, which leads to a loss in current and lower maximum power output. In addition, the emitted PL from the device rises on the exact same timescales due to the accumulation of electronic charges in the active layer. Using transient charge extraction measurements, it is shown that these observations cannot be explained by doping‐induced electronic charges but by the movement of mobile ions toward the perovskite/transport layer interfaces, which inhibits charge extraction due to band flattening. Finally, these findings are generalized to lead‐based perovskites, showing that the loss mechanism is universal. This elucidates the negative role mobile ions play in perovskite solar cells and paves a path toward understanding and mitigating a key loss mechanism.
Efficient deterministic algorithms are proposed with logarithmic step complexities for the generation of entangled GHZN and WN states useful for quantum networks, and an implementation on the IBM quantum computer up to N=16 is demonstrated. Improved quality is then investigated using full quantum tomography for low‐N GHZ and W states. This is completed by parity oscillations and histogram distance for large‐N GHZ and W states, respectively. Robust states are built with about twice the number of quantum bits which were previously achieved.
Perovskite semiconductors differ from most inorganic and organic semiconductors due to the presence of mobile ions in the material. Although the phenomenon is intensively investigated, important questions such as the exact impact of the mobile ions on the steady‐state power conversion efficiency (PCE) and stability remain. Herein, a simple method is proposed to estimate the efficiency loss due to mobile ions via “fast‐hysteresis” measurements by preventing the perturbation of mobile ions out of their equilibrium position at fast scan speeds (1000 V s−1). The “ion‐free” PCE is between 1% and 3% higher than the steady‐state PCE, demonstrating the importance of ion‐induced losses, even in cells with low levels of hysteresis at typical scan speeds (100 mV s−1). The hysteresis over many orders of magnitude in scan speed provides important information on the effective ion diffusion constant from the peak hysteresis position. The fast‐hysteresis measurements are corroborated by transient charge extraction and capacitance measurements and numerical simulations, which confirm the experimental findings and provide important insights into the charge carrier dynamics. The proposed method to quantify PCE losses due to field screening induced by mobile ions clarifies several important experimental observations and opens up a large range of future experiments.
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