Transparent conducting thin-films of SnO2: F were grown on preheated glass, Al2O3 coated glass, and quartz substrates by Streaming Process for Electrodeless Electrochemical Deposition (SPEED). Stannic chloride (SnCl4) and ammonium fluoride (NH4F) dissolved in a mixture of deionized water and organic solvents were used as precursors. The preheated substrate temperature was varied between 440 and 500 °C. High quality SnO2:F films were grown at all the substrate temperatures studied. The resulting typical film thickness was 250 nm. X-ray diffraction shows that the grown films are polycrystalline SnO2 with a tetragonal crystal structure. The average optical transmission of the films was around 93% throughout the wavelength range 400 to 1000 nm. The lowest electrical resistivity achieved was 6 × 10-4 Ω-cm. The Hall measurements showed that the film is an n-type semiconductor, with carrier mobility of 8.3 cm2/V-s, and carrier concentration of 1 × 1021 cm-3. The direct bandgap was determined to be 4.0 eV from the transmittance spectrum.
Thin-film resonant absorbers for the far-IR spectral range were fabricated, characterized, and modeled. The 3-μm-thick structure comprises a periodic surface array of metal squares, a dielectric spacer and a metallic ground plane. Up to 95% absorption for the fundamental band at ~53.5μm wavelength (5.6 THz) is achieved experimentally. Absorption bands are independent of the structure period and only weakly dependent on polarization and incident angle. The results are well explained in terms of standing-wave resonances within individual metal-dielectric-metal cavities. The structure has application as a wavelength selective coating for far-IR bolometers.
Optical constants for evaporated bismuth (Bi) films were measured by ellipsometry and compared with those published for single crystal and melt-cast polycrystalline Bi in the wavelength range of 1 to 40 μm. The bulk plasma frequency ω p and high-frequency limit to the permittivity ε ∞ were determined from the long-wave portion of the permittivity spectrum, taking previously published values for the relaxation time τ and effective mass m Ã. This part of the complex permittivity spectrum was confirmed by comparing calculated and measured reflectivity spectra in the far-infrared. Properties of surface polaritons (SPs) in the long-wave infrared were calculated to evaluate the potential of Bi for applications in infrared plasmonics. Measured excitation resonances for SPs on Bi lamellar gratings agree well with calculated resonance spectra based on grating geometry and complex permittivity.
Fluorine-doped tin oxides (FTO) were investigated for infrared plasmonic applications. Nano-crystalline FTO thin films were grown by the SPEED chemical-spray deposition method. Complex permittivity spectra were measured from 1.6 to 12 μm wavelength. These spectra were used to calculate materials parameters, which compared well with values from transport measurements, and to predict characteristics of surface plasmon polaritons (SPP). Reflectivity spectra for lamellar FTO gratings revealed SPP coupling resonances in good agreement with predictions. The FTO film studied here is well suited for plasmonic applications in the important 3-5 μm wavelength range.
Growth of Au nanoparticle films and the effect of nanoparticle shape on plasmon peak wavelength A thin-film selective absorber at visible and near infra-red wavelengths is demonstrated. The structure consists of an optically thick layer of gold, a SiO 2 dielectric spacer and a partially transparent gold film on top. The optical cavity so formed traps and absorbs light at a resonance wavelength determined by the film thicknesses. Observed fundamental-resonance absorption strengths are in the range 93%-97%. The absorption red-shifts and broadens as the thickness of the top gold layer is decreased with little change in absorption strength. Thus, strong absorption with design-tunable wavelength and width is achieved easily by unstructured blanket depositions. Observed angle-dependent spectra agree well with the recent three-layer analytical model of Shu et al. [Opt. Express 21, 25307 (2013)], if effective medium approximation is used to calculate the permittivity of the top gold film when it becomes discontinuous at the lowest thicknesses. V C 2014 AIP Publishing LLC. [http://dx.
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