An experimental method for accurate polarimetric characterization of speckle field below its transverse correlation width is proposed. Using a polarimetric analyzer, the speckle field under investigation is probed by a set of polarimetric projections describing the full Poincaré sphere surface. Spatial polarimetric variations of the speckle field are thus observed with an accuracy of 1% for each Stokes parameter. Moreover, all the experimental data can be guaranteed by a validity criterion. Using white paper sheet and rough metal samples, the method exhibits strong potential to analyze and differentiate speckle fields generated by bulk and surface scattering.

Abstract:Using a recent method able to characterize the polarimetry of a random field with high polarimetric and spatial accuracy even near places of destructive interference, we study polarized optical vortices at a scale below the transverse correlation width of a speckle field. We perform high accuracy polarimetric measurements of known singularities described with an half-integer topological index and we study rare integer index singularities which have, to our knowledge, never been observed in a speckle field.

In this paper, we propose the simulation of polarized speckle fields using the Stokes formalism, which allows the description of partially polarized electromagnetic waves. We define a unique parameter which determines the partial decorrelation of the involved fields, allowing to simulate the polarized speckles produced by all types of scatterers, from simple to multiple scatterers. We validate this model by comparison with experimental measurements. We use that simulation model to study the impact of the imaging device parameters on polarimetric measurements: first we emphasize a limit of resolution on retardance measurements, then we study the spatial depolarization, which appears when an observer is measuring any space-variant polarization map.

Spectralons are reference radiometric samples which exhibit a calibrated reflectance. However, in case of low reflectance samples, the degree of polarization (DOP) of scattered light is hard to characterize. Here, an accurate determination of spectralon spatial depolarization is proposed. Based on a spatially resolved polarimetric imaging system, the polarization state of the scattered light is characterized for every pixel. A statistic distribution analysis is carried out over the entire image. The relative phase shift distribution between two orthogonal components of the scattered electric field clearly exhibits a high sensitivity to the reflectance, the phase statistics following a circular Voigt profile. The intrinsic part of the spatial depolarization is demonstrated to be linked to the circular Cauchy contribution of that phase dispersion. An analytic equation is proposed to estimate the monochromatic spatially integrated DOP, as a function of the reflectance.

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