Latest record efficiencies of Cu(In,Ga)Se2 (CIGSe) solar cells were achieved by means of a rubidium fluoride (RbF) post-deposition treatment (PDT). To understand the effect of the RbF-PDT on the surface chemistry of CIGSe and its interaction with sodium that is generally present in the CIGSe absorber, we performed an X-ray photoelectron spectroscopy (XPS) study on CIGSe thin films as-deposited by a three-stage co-evaporation process and after the consecutive RbF-PDT. The sample transfer from the deposition to the XPS analysis chamber was performed via an ultra-high vacuum transfer system. This allows to minimize air exposure, avoiding oxide formation on the CIGSe surface, especially for alkali-treated absorbers. Beside an expected reduction of Cu-and Ga-content at the surface of RbF-treated CIGSe films, we find that Rb penetrates the CIGSe and, contrary to fluorine, it is not completely removed by subsequent ammonia etching. The remaining Rb contribution at 110.0 eV binding energy, which appears after the RbF-PDT is similar to the one detected on a coevaporated RbInSe2 reference sample and together with a new Se 3d contribution may hence belong to an Rb-In-Se secondary phase on the CIGSe surface. In addition, Na is driven towards the surface of the CIGSe absorber as a direct result of the RbF-PDT. This proves the ion-exchange mechanism in the absence of moisture and air/oxygen between heavy Rb atoms incorporated via PDT and lighter Na atoms supplied by the glass substrate. A remaining XPS signal of Na 1s is observed after etching the vacuum transferred RbF-CIGSe sample, indicating that Rb and/or F are not as much a driving force for Na as oxygen usually is.

Thin film solar cells based on co‐evaporated Cu(In,Ga)Se2 absorber films present the highest efficiencies among current polycrystalline thin‐film technologies. Thanks to the development of a novel experimental setup for in situ growth studies, it was possible to follow the formation of the crystalline phases during such deposition processes for the first time. This synchrotron‐based energy‐dispersive X‐ray diffraction and fluorescence setup is suited for real‐time studies of thin film vapor deposition processes. Focusing on the growth of CuInSe2 and CuGaSe2 fabricated by three‐stage processing, we find that the phase transitions in the Cu‐In‐Se system follow the reported pseudo‐binary In2Se3‐Cu2Se phase diagram. This requires a transformation of the Se sublattice during the incorporation of Cu‐Se into the In2Se3 precursor film from the first process stage. In the Cu‐Ga‐Se system, besides an increase in the lattice spacings, we observe no transformation of the Se sublattice. Furthermore, the structural defects of the Ga‐Se precursor film are preserved until the CuGaSe2 stoichiometry is reached. By means of model calculations of the fluorescence signals, we confirm in both systems the segregation of Cu2Se at the surface near a concentration of 25 at.% Cu shortly after the recrystallization of the films. The modeling also reveals that Cu2Se penetrates into the CuInSe2 film, whereas it remains at the surface of the CuGaSe2 film.

While presence of Na is essential for the performance of high-efficiency Cu(In,Ga)Se2 thin film solar cells, the reasons why addition of Na by post-deposition treatment is superior to pre-deposition Na supply—particularly at low growth temperatures—are not yet fully understood. Here, we show by X-ray diffraction and electron microscopy that Na impedes annihilation of stacking faults during the Cu-poor/Cu-rich transition of low temperature 3-stage co-evaporation and prevents Cu homogeneity on a microscopic level. Lower charge carrier mobilities are found by optical pump terahertz probe spectroscopy for samples with remaining high stacking fault density, indicating a detrimental effect on electronic properties if Na is present during growth.

In polycrystalline compound semiconductor thin lms, structural defects such as grain boundaries as well as lateral stress can form during lm growth, which may deteriorate their electronic performance and mechanical stability. In Cu-based chalcogenide semiconductors such as Cu(In, Ga)Se2 or Cu2ZnSn(S, Se)4, temporary Cu excess during lm growth leads to improved microstructure such as a reduced grain boundary density, a strategy that has been used for decades for high-eciency chalcopyrite thin lm solar cells. However, the mechanisms responsible for the benecial eect of Cu-excess are yet not fully claried. Here, we investigate the evolution of lateral stress, grain growth and Cu-Se segregation during Cu-Se deposition onto Cu-poor CuInSe2. Real-time x-ray diraction and uorescence analysis with a double-detector setup reveals that sudden stress relaxation occurs shortly prior to Cu-Se segregation at the surface and precisely coincides with domain growth and change of texture. Numerical reaction-diusion modeling provides an explanation for the observed delay of Cu-Se segregation. Our results show that partial recrystallization of the lm can be already reached without the necessity of an overall Cu-rich lm composition and thus suggest a new synthesis route for the fabrication of high-quality chalcopyrite absorber lms.Co-evaporation of Cu(In, Ga)Se 2 (CIGSe) lms -used as absorber layer in thin lm solar cells with world record energy conversion eciencies 1,2 -features a puzzling peculiarity: For the nal lm, a Cu-poor composi-is required to obtain highest eciencies; however, during deposition, the lm composition is changed from an initially Cu-poor composition to an intermediate Cu-rich composition and nally changed back to a Cu-poor composition. The composition modications during lm deposition are realized by varying the Cu and In+Ga evaporation uxes. Two crucial ndings point out the importance of the Cu-poor → Cu-rich transition: First, highest eciencies are only achieved if an intermediate Cu-rich lm composition was reached during lm deposition. 3 Second, a three-stage process with a Cu-poor → Cu-rich → Cu-poor sequence leads to higher eciencies than a two-stage process with only a Cu-rich → Cu-poor sequence. 46 Thus, it seems that the key challenge in understanding the success of the three-stage process over the two stage-process is -besides the adjustment of an ideal Ga gradient -the identication of the reactions and their driving forces acting during the Cu-poor → Cu-rich transition.While the eect of the Cu-poor → Cu-rich transition on structural and morphological changes in CIGSe lms such as grain growth 710 as well as on electronic properties of the material 3,11 has been thoroughly investigated in the past decade, the physical mechanisms and driving forces of these changes are not fully understood. Reduction of grain boundary (GB) energies or defect densities were proposed as possible driving forces for grain growth; 79 however, no attention has so far been paid to the potential role of stress energy for the mic...

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