Plastically anisotropic/layered solids are ubiquitous in nature and understanding how they deform is crucial in geology, nuclear engineering, microelectronics, among other fields. Recently, a new defect termed a ripplocation–best described as an atomic scale ripple–was proposed to explain deformation in two-dimensional solids. Herein, we leverage atomistic simulations of graphite to extend the ripplocation idea to bulk layered solids, and confirm that it is essentially a buckling phenomenon. In contrast to dislocations, bulk ripplocations have no Burgers vector and no polarity. In graphite, ripplocations are attracted to other ripplocations, both within the same, and on adjacent layers, the latter resulting in kink boundaries. Furthermore, we present transmission electron microscopy evidence consistent with the existence of bulk ripplocations in Ti3SiC2. Ripplocations are a topological imperative, as they allow atomic layers to glide relative to each other without breaking the in-plane bonds. A more complete understanding of their mechanics and behavior is critically important, and could profoundly influence our current understanding of how graphite, layered silicates, the MAX phases, and many other plastically anisotropic/layered solids, deform and accommodate strain.
In atomistic simulations, diffusion energy barriers are usually calculated for each atomic jump path using a nudged elastic band method. Practical materials often involve thousands of distinct atomic jump paths that are not known a priori. Hence, it is often preferred to determine an overall diffusion energy barrier and an overall pre-exponential factor from the Arrhenius equation constructed through molecular dynamics simulations of mean square displacement of the diffusion species at different temperatures. This approach has been well established for interstitial diffusion, but not for substitutional diffusion at the same confidence. Using In 0.1 Ga 0.9 N as an example, we have identified conditions where molecular dynamics simulations can be used to calculate highly converged Arrhenius plots for substitutional alloys. This may enable many complex diffusion problems to be easily and reliably studied in the future using molecular dynamics, provided that moderate computing resources are available. I. INTRODUCTION As the most pervasive rate-limiting mechanism, diffusion impacts almost all the kinetic problems of materials. In the past, theoretical studies of diffusion are usually done through the calculations of the state transition energy barriers for each atomic jump path using molecular statics (MS) simulations in combination with a nudged elastic band method 1,2,3. The problem is that practical materials often involve thousands or more distinct atomic jumps that are not known a priori. It is also unclear as how a large multitude of distinct diffusion energy barriers relate to
Many methods used to produce nanocrystalline (NC) materials leave behind non-equilibrium grain boundaries (GBs) containing excess free volume and higher energy than their equilibrium counterparts with identical 5 degrees of freedom. Since non-equilibrium GBs have increased amounts of both strain and free volume, these boundaries may act as more efficient sinks for the excess interstitials and vacancies produced in a material under irradiation as compared to equilibrium GBs. The relative sink strengths of equilibrium and non-equilibrium GBs were explored by comparing the behavior of annealed (equilibrium) and as-deposited (non-equilibrium) NC iron films on irradiation. These results were coupled with atomistic simulations to better reveal the underlying processes occurring on timescales too short to capture using in situ TEM. After irradiation, NC iron with non-equilibrium GBs contains both a smaller number density of defect clusters and a smaller average defect cluster size. Simulations showed that excess free volume contribute to a decreased survival rate of point defects in cascades occurring adjacent to the GB and that these boundaries undergo less dramatic changes in structure upon irradiation. These results suggest that non-equilibrium GBs act as more efficient sinks for defects and could be utilized to create more radiation tolerant materials in future.
Herein we present experimental and modeling evidence for a new deformation micromechanism operating in layered solids termed a ripplocation. Select Ti 3 SiC 2 grains were cyclically indented-either parallel or normal to the basal planes-with spherical tips with radii, R of 21 μm and 100 μm. When the load vs. displacement curves were converted to indentation stress vs. a/R curves, where a is the contact radius, fully and spontaneously reversible hysteresis loops were recorded. The energy dissipated per unit volume per cycle, W d , was found to be a function of basal plane orientation; W d was smaller when the basal planes were loaded edge on. Transmission electron microscope images of areas under the indentations revealed the existence of defects that previous worked confirmed have a strain component along the c-axis and for which no g b condition was found that resulted in their disappearance. These defects thus cannot be basal dislocations; their characteristics, however, are consistent with bulk ripplocations, BRs. It is the to-and-from movement of these BRs-and not basal dislocations as previously assumed-that is believed to be responsible for the fully and spontaneously reversible loops in Ti 3 SiC 2 and possibly in most other layered solids. Consistent with the need of the basal planes to expand upon the introduction of BRs, the initial friction stress needed to move them was found to be almost three times lower when the basal planes were loaded edge-on. Molecular dynamics simulations on graphite at 10 K faithfully reproduce many features observed below the indenter in this, and previous, work on Ti 3 SiC 2. The existence of BRs will require a revisiting and reassessment of our understanding of how layered solids-from geologic formations to 2D solids-deform.
We investigate the formation of extended defects during molecular-dynamics (MD) simulations of GaN and InGaN growth on (0001) and ([Formula: see text]) wurtzite-GaN surfaces. The simulated growths are conducted on an atypically large scale by sequentially injecting nearly a million individual vapor-phase atoms towards a fixed GaN surface; we apply time-and-position-dependent boundary constraints that vary the ensemble treatments of the vapor-phase, the near-surface solid-phase, and the bulk-like regions of the growing layer. The simulations employ newly optimized Stillinger-Weber In-Ga-N-system potentials, wherein multiple binary and ternary structures are included in the underlying density-functional-theory training sets, allowing improved treatment of In-Ga-related atomic interactions. To examine the effect of growth conditions, we study a matrix of >30 different MD-growth simulations for a range of In Ga N-alloy compositions (0 ≤ ≤ 0.4) and homologous growth temperatures [0.50 ≤ () ≤ 0.90], where () is the simulated melting point. Growths conducted on polar (0001) GaN substrates exhibit the formation of various extended defects including stacking faults/polymorphism, associated domain boundaries, surface roughness, dislocations, and voids. In contrast, selected growths conducted on semi-polar ([Formula: see text]) GaN, where the wurtzite-phase stacking sequence is revealed at the surface, exhibit the formation of far fewer stacking faults. We discuss variations in the defect formation with the MD growth conditions, and we compare the resulting simulated films to existing experimental observations in InGaN/GaN. While the palette of defects observed by MD closely resembles those observed in the past experiments, further work is needed to achieve truly predictive large-scale simulations of InGaN/GaN crystal growth using MD methodologies.
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