The pore structure of sandstone in an oil reservoir is investigated using atomic force microscopy (AFM). At nanoscale resolution, AFM images of sandstone show us the fine structure. The real height data of images display the three-dimensional space structure of sandstone effectively. The three-dimensional analysis results show that the AFM images of sandstone have unique characteristics that, like fingerprints, can identify different structural properties of sandstones. The results demonstrate that AFM is an effective method used to represent original sandstone in petroleum reservoirs, and may help geologists to appreciate the sandstone in oil reservoirs fully.
ABSTMCTIn this paper,we simply introduce the theory of Scanning Tunnelling Microscopy ( STM ) and Atomic Force Microscopy ( AFM ).Then we investigate the morphology and structure of read-only memory ( ROM )in Ultra-Large-Scale-Integration ( ULSI ).Structural parameters of ROM,both horizontal and vertica1,are measured precisely.Also,we put AFM into observation of polycrystalline silicon surface with cloud defect.By comparison,we also observed the surface of polycrystalline silicon without cloud defect.We found the cloud polycrystalline silicon surface was formed by pits with different sizes.But the normal polycrystalline silicon surface was not.0ur experiments show that SPM is a powerful tool for characterization in microelectronics.
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