Properties of CdS thin films were investigated applying atomic force
microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by
using thermal evaporation technique under base pressure 2 x 10-5 torr. The
quality of these films was investigated by AFM spectroscopy. We apply Raman
scattering to investigate optical properties of CdS thin films, and reveal
existence of surface optical phonon (SOP) mode at 297 cm-1. Effective
permittivity of mixture were modeled by Maxwell - Garnet approximation.
[Projekat Ministarstva nauke Republike Srbije, br. 45003]
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