Comment on "A nanopositioner for scanning probe microscopy: The KoalaDrive" [Rev. Sci. Instrum. 83, 023703 (2012)] Rev. Sci. Instrum. 83, 097101 (2012) Three-axis correction of distortion due to positional drift in scanning probe microscopy Rev. Sci. Instrum. 83, 083711 (2012) A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics Rev. Sci. Instrum. 83, 083702 (2012) Scanning gate microscopy on a graphene nanoribbon Appl. Phys. Lett. 101, 063101 (2012) Additional information on Rev. Sci. Instrum. This paper explores the fundamental limits of the use of quartz tuning forks as force detectors in scanned probe microscopy. It is demonstrated that at room temperature, pressure, and atmosphere these force sensors have a noise floor of 0.62 pN/ͱHz and exhibit a root mean square Brownian motion of only 0.32 pm. When operated as a shear force sensor both dissipative and reactive forces are detected on approach to the sample. These forces are sufficient to reduce the amplitude of motion of the probe nearly to zero without physically contacting the surface. It is also demonstrated that conventional proportional-integral feedback control yields closed loop responses at least 40 times faster than their open loop response.
ObjectiveThe objective of this study was to investigate the effect of mechanical strain by mapping physicochemical properties at periodontal ligament (PDL)–bone and PDL–cementum attachment sites and within the tissues per se.DesignAccentuated mechanical strain was induced by applying a unidirectional force of 0.06 N for 14 days on molars in a rat model. The associated changes in functional space between the tooth and bone, mineral forming and resorbing events at the PDL–bone and PDL–cementum attachment sites were identified by using micro-X-ray computed tomography (micro-XCT), atomic force microscopy (AFM), dynamic histomorphometry, Raman microspectroscopy, and AFM-based nanoindentation technique. Results from these analytical techniques were correlated with histochemical strains specific to low and high molecular weight GAGs, including biglycan, and osteoclast distribution through tartrate resistant acid phosphatase (TRAP) staining.ResultsUnique chemical and mechanical qualities including heterogeneous bony fingers with hygroscopic Sharpey's fibers contributing to a higher organic (amide III — 1240 cm− 1) to inorganic (phosphate — 960 cm− 1) ratio, with lower average elastic modulus of 8 GPa versus 12 GPa in unadapted regions were identified. Furthermore, an increased presence of elemental Zn in cement lines and mineralizing fronts of PDL–bone was observed. Adapted regions containing bony fingers exhibited woven bone-like architecture and these regions rich in biglycan (BGN) and bone sialoprotein (BSP) also contained high-molecular weight polysaccharides predominantly at the site of polarized bone growth.ConclusionsFrom a fundamental science perspective the shift in local properties due to strain amplification at the soft–hard tissue attachment sites is governed by semiautonomous cellular events at the PDL–bone and PDL–cementum sites. Over time, these strain-mediated events can alter the physicochemical properties of tissues per se, and consequently the overall biomechanics of the bone–PDL–tooth complex. From a clinical perspective, the shifts in magnitude and duration of forces on the periodontal ligament can prompt a shift in physiologic mineral apposition in cementum and alveolar bone albeit of an adapted quality owing to the rapid mechanical translation of the tooth.
Discrete and coalesced monocrystalline GaN and AlxGa1−xN layers grown via pendeo-epitaxy (PE) originated from side walls of GaN seed stripes with and without SiNx top masks have been grown via organometallic vapor phase deposition on GaN/AlN/6H-SiC(0001) and GaN(0001)/AlN(0001)/3C-SiC(111)/Si(111) substrates. Scanning and transmission electron microscopies were used to evaluate the external microstructures and the distribution of dislocations, respectively. The dislocation density in the laterally grown sidewall regions and in the regions grown over the SiNx masks was reduced by at least five orders of magnitude relative to the initial GaN seed layers. Tilting of 0.2° in the coalesced GaN epilayers grown over the SiNx masks was determined via X-ray and selected area diffraction; however, tilting was not observed in the material suspended above the SiC substrate and that grown on unmasked stripes. A strong, low-temperature photoluminescence band-edge peak at ~3.45 eV with a FWHM of <300 µeV was determined on the overgrowth material grown on the silicon carbide substrates. The band-edge in the GaN grown on silicon substrates was shifted to a lower energy by 10 meV, indicative of a greater tensile stress.
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