Epitaxial films of Ni, Co, and Fe of thickness (10 -500 A) have been studied on Cu(100) seed layers grown at room temperature on Si(100) substrates freshly etched in a hydrofluoric acid solution. X-ray diffraction and reflection high-energy electron-diffraction measurements confirm the epitaxial growth of Ni and Co on Cu(100) with a fcc(100) structure, whereas Fe grows with a bcc(110) Pitsch orientation relationship. Ferromagnetic-resonance measurements have been used to study the in-plane and out-ofplane magnetic anisotropies of these films. Experimental data were fitted by using energy-density expressions that include uniaxial perpendicular anisotropy and bulk cubic anisotropy terms. Ni films with 0 thicknesses (100 A show strong perpendicular magnetic anisotropy, which is attributed to a tetragonal deformation of the Ni lattice.
The effect of microstructure on the temperature dependence of the interlayer coupling in Co/Cu multilayers Co(22 A)/Cu multilayers with Cu thicknesses varying from 6 to 40 A are studied by vibrating-sample magnetometry and ferromagnetic-resonance spectroscopy (FMR). The magnetization was found to increase with decreasing Cu thickness, whereas the linewidth of the uniform mode of the FMR was found to decrease. This is attributed to the spin polarization of the Cu layers due to interlayer coupling and its effect on the lowered dimensionality of the Co layers. We also observed a peak on the high-field side of the uniform FMR mode, which we attribute to antiparallel coupling of adjacent ferromagnetic layers producing an "optical" mode. 0 1995 American Institute of Physics.
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