A novel capacitor devicewith a high, frequency‐independent dielectric constant has been fabricated by a simple powder processing route. A mixture of microparticles of ferroelectric BaTiO3 and de‐passivated metallic nickel was sintered to yield percolative composites in which the system of conducting particles separated by insulator layers (see Figure for an SEM image) exhibits a dielectric constant higher than that of either component.
correlated with surface chemistry, characterized by X-ray photoelectron spectroscopy. The surface texture, thickness, and elastic modulus of the films indicate potential for integration in semiconductor interconnects.
As part of a research program devoted to the microstructural characterization of Al 2 TiO 5 -based compounds, high resolution electron microscopy (HREM) has been undertaken in order to study the crystallographic arrangement, especially ordering possibilities, of Al and Ti cations in the metallic sublattice of aluminum titanate. It is seen that adequate experimental conditions, mainly defocus setting, for a resolution of at least 2.5 A point-to-point, enable the disordered model to be directly and unambiguously proved on [100]-oriented micrographs.
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