Role of Ag seed layer for CoCrPt/Ti perpendicular recording media J. Appl. Phys. 93, 7741 (2003); 10.1063/1.1540153Long-range order and short-range order study on CoCrPt/Ti films by synchrotron x-ray scattering and extended x-ray absorption fine structure spectroscopyThe structure and interface of Co 74 Cr 16 Pt 10 ͑40 nm thick͒/Ti ͑10 nm thick͒ films for perpendicular magnetic recording were studied using x-ray scattering and transmission electron microscopy. Improved out-of-plane coercivity and squareness resulted from the combined effects of higher crystallinity and better texture of the CoCrPt ͑002͒ film, and increased interface roughness. The relationship of sputtering pressure to the structural effects is discussed.
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