Modulation of the probe height in a scanning near-field optical microscope (SNOM) is a technique that is commonly used for both distance control and separation of the near-field signal from a background. Detection of higher harmonic modulated signals has also been used to obtain an improvement in resolution, the elimination of background, or artifacts in the signal. This article presents a theoretical model for the effects induced in SNOM images by modulation of the probe. It is shown that probe modulation introduces a spatial filter into the image, generally suppressing propagating field components and enhancing the strength of evanescent field components. A simple example of detection of a single evanescent field above a prism is studied in some detail, and a complicated dependence on modulation parameters and waveform is shown. Some aspects of the application of this theory in a general experimental situation are discussed. Simulated images are displayed to explicitly show the effects of varying modulation amplitude with first and second harmonic detection. Finally, we discuss the suppression of background artifacts due to propagating fields through the use of higher harmonic detection.
Scanning near-field optical microscopy has been recently applied to the imaging of magnetic samples. It was shown experimentally that an apertureless microscope suffers a substantial loss of resolution when used for magneto-optical imaging compared with that for conventional imaging. No such change is observed for aperture microscopes. We explain this observation by developing a model for the imaging process that incorporates the response of the probe. We calculate real observable properties such as the rotation of polarization at the detector or the circular dichroism signal and thus simulate magneto-optical images of a domain structure in cobalt for both aperture and apertureless microscopes.
Subwavelength-resolution phase images of phase dislocations at the focal region of a 20x , 0.4-N.A. lens have been obtained by use of an optical fiber interferometer with a tapered probe in one arm. A phase-stepping algorithm is used to determine a quantitative value of the phase at each point in the scan, clearly showing the presence of edge dislocations between the Airy rings of the diffraction pattern near the lens focus, as well as four isolated screw-type singularties caused by astigmatism in the lens.
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