The variation in the microhardness of tin-di-iodide (SnI2) and tin-tetra-iodide (SnI4) crystals has been determined using Vicker's microhardness indentor. It is observed that the microhardness of the crystals depends on the applied load and is independent of the duratidn of loading. Viekers Hardness Numerals (VHN) for SnI 2 is found to be greater than that of SnI 4 crystals. Mayer's equation and implications have been discussed.
Optical and scanning electron microscopic observations have been made of tin-iodide whiskers crystals grown by the gel-method. Most of the whiskers have been found to be of two types: (i) hollow and (ii) solid whiskers. The observations indicate that the formation of hollow whiskers is possible with or without the presence of impurities. By using electron micro probe, the overgrowth of tin-tetra iodide crystals on tin-iodide whisker crystals have been identified. A growth mechanism for tin-iodide whiskers have been suggested. The implications are discussed.
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