Porous anodic alumina films grown in sulfuric acid and similar specimens sealed in nickel acetate and dichromate sealing baths were subjected to a number of surface and bulk analytical techniques (XPS, RBS, SIMS, and XRD). All the oxide films were found to be amorphous‐like in nature, to contain significant amounts of H, and have a S content of 1.5–3 atomic percent (a/o) uniformly distributed throughout the oxide matrices. For the sealed oxide films, surface enrichment of Ni and Cr species was observed, being particularly significant in the case of Ni. Uniform bulk concentrations for Ni and Cr were found to be of the order of 0.5 and 1 a/o, respectively. The S, Ni, and Cr species present in the oxide films were identified as sulfate‐like, nickel hydroxide and dichromate‐like in nature. Ion beam‐induced reduction of incorporated S, Ni, Cr, and C species was observed.
ChemInform Abstract A broad range of surface and bulk analytical techniques, as XPS, RBS, SIMS, and XRD, are applied to Al specimens anodized in H2SO4 and similar specimens sealed in Ni-acetate and dichromate baths. All the films are amorphous in nature and contain C, significant amounts of H and 1.5-3 at.% S distributed uniformly throughout the oxide matrix. Surface enrichment of Ni and Cr species is observed for the sealed oxide films. This enrichment is of particular significance in the case of Ni. The uniform bulk concentrations of Ni and Cr are of the order of 0.5 and 1 at.%, respectively. The various species present in the films are identified as sulfate-like, Ni(OH)2, and dichromate-like in nature. As a result of ion beam-induced surface chemistry, incorporated Cr, Ni, S, and C are also present in lower oxidation states.
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