LIST OF TABLES Table 1 Table Table Table Table Working The transducer to be calibrated is mounted near the base of the thick-walled aluminum tube forming the vessel so that the pressure-sensitive element is in contact with the liquid in the tube.A section of the tube is filled with small steel balls to damp the motion of the 10-St dimethyl siloxane working fluid in order to extend the useful frequency range to higher frequencies than would be provided by an undamped system. The dynamic response of six transducers provided by the sponsor was evaluated using the pressure sources; the results of these calibrations are given. Key words:calibration; dynamic; dynamic calibration; dynamic pressure; dynamic pressure source; liquid column; pressure; pressure source; pressure transducer; sinusoidal pressure; transducer. In the current work, this method has been modified and extended [2, 3] in both amplitude and frequency capability to result in a source of sinusoidal ly varying pressures of up to 3^kPa zeroto-peak (about 5 psi zero-to-peak), over the frequency range of approximately 50 Hz to 2 kHz. The source is intended for the dynamic calibration of pressure transducers and consists of a liquid-filled cylindrical vessel, 11 cm in height, mounted upright on the armature of a vibration exciter which is driven by an amplified sinusoidal ly varying voltage. The transducer to be calibrated is mounted near the base of the thick-walled aluminum tube forming the vessel so that the pressure-sensitive element is in contact with the liquid in the tube. A section of the tube is filled with small steel balls to damp the motion of the 10-St dimethyl siloxane working fluid in order to extend the useful frequency range to higher frequencies than would be provided by an undamped system.Both the natural frequency and the degree of damping of the combined 1 iquid-col umn-and-transducer structure determine the useful upper frequency limit. Damping is also an important consideration because a damped system may have a higher useful frequency range than the same system undamped. With an undamped, single-degree-of-f reedom system, the amplitude-frequency response remains constant within +5% up to approximately 20% of the natural frequency. EXPERIMENTAL DEVELOPMENT OF SOURCEIn a system with optimum damping (a damping ratio of about 0.6 of critical), the amplitude-frequency response remains constant within +5% to about 80% of the natural frequency [3, A] . To maintain a flat response to 2 kHz thus requires an undamped system with a natural frequency of 10 kHz, an optimally damped system with a natural frequency of 2.5 kHz, or a non-optimal ly damped system with a natural frequency between 2.5 and 10 kHz, with the exact natural frequency required dependent on the degree of damping. 2.1.1Pressure Ampl itude -The factors that in combination determine the pressure levels attainable over the frequency range of interest are (1) the force and displacement capabilities of the vibration exciter, (2) the density of available working fluids, (3) th...
This issue contains abstracts for all Center papers released for publication by NBS in the quarter and citations and abstracts for Center papers published in the quarter.Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author under each subheading within each topic.Unpublished papers appear under the subheading "Released for Publication".Papers published in the quarter appear under the subheading "Recently Published".Following each abstract is the telephone number of the individual to contact for more information on the topic; unless otherwise noted, this person is the first author.This issue also includes a calendar of Center conferences and workshops for the remainder of calendar year 1984, an announcement of newly released standard reference materials, and a list of sponsors of the work.Center for Electronics and Electrical Engineering :Center programs provide national reference standards, measurement methods, supporting theory and data, and traceability to national standards.The metrological products of these programs aid economic growth by promoting equity and efficiency in the marketplace, by removing metrological barriers to improved productivity and innovation, by increasing U. S. competitiveness in international markets through facilitation of compliance with international agreements, and by providing technical bases for the development of voluntary standards for domestic and international trade. These metrological products also aid in the development of rational regulatory policy and promote efficient functioning of technical programs of the Government.The work of the Center is divided into two major programs: the Semiconductor Technology Program, carried out by the Semiconductor Materials and Processes and Semiconductor Devices and Circuits Divisions in Gaithersburg, MD, and the Signals and Systems Metrology Program, carried out by the Electrosystems Division in Gaithersburg and the Electromagnetic Fields and Electromagnetic Technology Divisions in Boulder, CO.Key contacts in the Center are given on the back cover; readers are encouraged to contact any of these individuals for further information.
JATIONAL BUREAU OF STANDARDSThis issue of the CEEE Technical Progress Bulletin covers the first quarter of calendar year 1984. Organization of Bulletin :This issue contains abstracts for all papers released for publication by NBS in the quarter and citations and abstracts for papers published in the quarter.Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author under each subheading within each topic. Unpublished papers appear under the subheading "Released for Publication". Papers published in the quarter appear under the subheading "Recently Published".Following each abstract is the telephone number of the individual to contact for more information on the topic; unless otherwise noted, this person is the first author. This issue also includes a calendar of Center conferences and workshops for the remainder of calendar year 1984, an announcement of newly released standard reference materials, and a list of sponsors of the work. Center for Electronics and Electrical Engineering :Center programs provide national reference standards, measurement methods, supporting theory and data, and traceability to national standards.The metrological products of these programs aid economic growth by promoting equity and efficiency in the marketplace, by removing metrological barriers to improved productivity and innovation, by increasing U. S. competitiveness in international markets through facilitation of compliance with international agreements, and by providing technical bases for the development of voluntary standards for domestic and international trade. These metrological products also aid in the development of rational regulatory policy and promote efficient functioning of technical programs of the Government.The work of the Center is divided into two major programs: the Semiconductor Technology Program, carried out by the Semiconductor Materials and Processes and Semiconductor Devices and Circuits Divisions in Gaithersburg, MD, and the Signals and Systems Metrology Program, carried out by the Electrosystems Division in Gaithersburg and the Electromagnetic Fields and Electromagnetic Technology Divisions in Boulder, CO.Key contacts in the Center are given on the back cover; readers are encouraged to contact any of these individuals for further information.
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