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Recently, it has been shown that a new class of quasi-one-dimensional conductors can be created by doping discotic liquid crystals with appropriate oxidants. This paper reports the elucidation of the mechanism of conduction in these new materials. In particular, the ac conductivity of 2,3,6,7,10,11-hexahexyloxytriphenylene (HAT6) doped with the Lewis acid AlCl3, has been measured as a function of frequency (10−3–107 Hz), and temperature in its crystalline solid (K), hexagonal discotic liquid crystal (Dho), and isotropic liquid (I) phases. In all three phases the conductivity is independent of frequency at low frequencies, but shows a power law dependence on frequency [σ(ω)∼ωs, s∼0.7–0.8] at higher frequencies. This behavior is characteristic of charge carrier transport by a hopping mechanism. The conductivity data have been analyzed in terms of the Scher and Lax theory to obtain the parameters describing this process. In macroscopically aligned K and Dho phases, the conductivity measured along the column axes is approximately 103 greater than that in the perpendicular direction. The conduction along the columns is identified with a single charge transport process in which the carriers hop between localized states (radical cations) associated with AlCl4−-counterions linearly distributed off-axis along the columns. The charge carrier diffusion coefficient is independent of the concentration of dopant and has the value D∥∼3.4×10−10 m2 s−1 in the Dho phase at 343 K. In the isotropic melt phase, the conductivity measurements reveal the involvement of two distinct processes. One of these is identified with charge migration along supramolecular ‘‘stacks’’ some 200 nm in length, whilst the other appears to be associated with carriers hopping between these stacks. The conductivity behavior of the unaligned Dho and K phases is very similar to that of the isotropic liquid phase implying that the mesoscopic structure of the latter phase is ‘‘frozen-in’’ as a ‘‘defect structure’’ on cooling. This defect structure then dominates the conductivity behavior of the unaligned Dho and K phases.

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Rapid Prototyping (RP) is a method used everywhere from the entertainment industry to healthcare. Layer orientation is an important aspect of the final product. The objective of this research was to evaluate the effect of layer orientation on the mechanical strength and toughness of a polymer. The polymer used was a combination of two materials, ZP 130 and ZB 58, fused together in the Z Corporation Spectrum Z510 Rapid Prototyping Machine. ZP 130 is a powder composed of vinyl polymer (2-20%), sulfate salt (0-5%), and plaster that contains <1% crystalline silica (50-95%). ZB 58 is a liquid composed of glycerol (1-10%), preservative (sorbic acid salt) (0-2%), surfactant (<1%), pigment (<1%), and water (85-95%). After removal from the machine the samples were sealed with Z bond 101 which is Beta-methoxyethyl cyanoacrylate (60-100%). The layer orientations studied were the crack arrestor, crack divider, and short transverse with various combinations of the three, for a total of seven orientations. The mechanical strength was evaluated using tensile testing and three-point bend testing. The toughness was evaluated by Izod impact testing. Five samples for tensile testing and three-point bend testing as well as 15 samples for the Izod impact test for each of the seven orientations were made. The total number of samples was 175. The crack arrestor orientation was the strongest main orientation for the tensile and three-point bend test. Weibull analysis was done on the Izod impact testing due to high variation in the results for the crack arrestor and short transverse directions. It was found that the layer orientation and surface roughness played a significant role in the penetration of the Z bond 101 coating and in the overall strength of the samples.

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