Radon and its daughters are one of the most important background sources for low-background liquid scintillator (LS) detectors. The study of the diffusion behavior of radon in the LS contributes to the analysis of the related background caused by radon. Methodologies and devices for measuring radon's diffusion coefficient and solubility in materials are developed and described. The radon diffusion coefficient of the LS was measured for the first time and the solubility coefficient was also obtained. In addition, the radon diffusion coefficient of the polyolefine film which is consistent with data in the literature was measured to verify the reliability of the diffusion device.
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