The
CoO film deposited on the surface of F-doped SnO2 (FTO)
conductive glass was prepared via drop casting technique.
The effects of Ni2+-ion implantation at 700 keV energy
and postannealing in vacuum at 450 °C temperature on the local
structure of the CoO film was systematically explored. The XAFS study
revealed the substitution of octahedral Co2+ by Ni2+ ion (Co1–x
Ni
x
O) as a result of ion implantation. The existence
of defects in local structure around the octahedral Co for the Co1–x
Ni
x
O
film after thermal annealing in vacuum was demonstrated by the theoretical
EXAFS [χ(k)] simulation via evolutionary algorithm
implemented in reverse Monte Carlo method in rationale with EXAFS
fitting. Nevertheless, the cubic rock salt structure for the Co1–x
Ni
x
O
was conserved, corroborated through XRD patterns, suggesting a remarkable
candidate for application as an electrocatalyst in fuel cells.
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