Values of the transmittance T(s) and the phaseretardation D were recorded in situ at two angles duringthe growth of thin films of tantalum oxide, titanium oxide, andzirconium oxide for deposition angles theta(nu) in the range40 degrees -70 degrees . Column angles for the same films were determinedex situ from scanning electron microscopy photographs ofdeposition-plane fractures. We show that the experimental columnangles are smaller than the corresponding values predicted by thetangent-rule equation psi = tan(-1)(0.5 tan theta(nu)) and that the experimental values fit a modifiedform of the equation psi = tan(-1)(E(1) tan theta(nu)) where E(1) is less than 0.5. We also show that theprincipal refractive indices are represented well by quadraticfunctions of the deposition angle, for example, n(1)(theta(nu)) = A(0) + A(2) theta(nu)(2).
We present the technique of bideposition to realize thin-film helicoidal bianisotropic mediums (TFHBM's) that exhibit high optical activity. We show, by experiment as well as by simulation, that the optical rotation produced by these chiral sculptured thin films is roughly proportional to the square of the local linear birefringence. Experimental measurements on bideposited TFHBM's of titanium oxide yield a typical value of 5 degrees /mum for the effective specific rotation in the short-wavelength regime; the corresponding value determined for the standard unideposited TFHBM's is 1 degrees /mum. Both types of TFHBM's are highly optically active in comparison with quartz, fluorite films, and cholesteric liquid crystals. Bideposited TFHBM's will lend themselves to many different types of optical devices.
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