The subgap structure in current-voltage (I -V ) characteristics of a stack of intrinsic Josephson junctions in high-T c superconductors is studied. An analytical formula for the I -V characteristics is obtained which had taken into account the influence of the dynamically breaking of charge neutrality (DBCN) in CuO 2 layers on the subgap structure. It is shown that DBCN does not affect the positions and the amplitudes of the subgap peaks, but changes the curvature of the branches in the I -V characteristics. As a possible manifestation of the non-equivalence of the junction, the experimental I -V characteristics of intrinsic Josephson junctions are presented.
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