The enhancement of the out‐coupling efficiency of organic light‐emitting diodes (OLEDs) is still the subject of research and development. Bottom‐emission OLEDs emit light through the glass substrate into air. Due to the difference of the refractive indices between glass and air, a significant amount of light is reflected at the glass–air interface back into the glass because of total internal reflection. One possibility to avoid total internal reflection at the glass–air interface is the use of lenses. Herein, the concept of macrolenses for pixelated OLEDs is presented. For the design of the lenses, the vertical and horizontal dimensions of the OLED have to be considered, and the contact angle of the lens has to be adapted to the geometrical conditions. A process based on inkjet etching and inkjet printing has been developed which now allows the printing of lenses with defined radius and contact angle. Measurements of the luminance show an improved out‐coupling efficiency.
X-ray reflectivity (XRR) has been proven to be a useful tool to investigate thin layers as well as buried interfaces in stacks built of very thin layers. Nevertheless, x-ray reflectivity measurements are limited by the roughness of the layers and interfaces as the roughness destroys the interference structure, the so-called Kiessig fringes. As investigations of thin layers in organic light emitting devices (OLEDs) are still subject of research and development, the focus of this paper is the investigation of a layer of indium tin oxide (ITO) which serves as transparent anode material in OLEDs. Due to the fabrication process, ITO shows rough surface structures, so-called spikes, hindering the determination of the ITO layer thickness and roughness in XRR measurements. In this paper, it is theoretically and experimentally proven that a smoothing layer on the ITO enables the determination of the buried ITO layer thickness and roughness as well as the density of the spikes. Furthermore, a sputtered aluminum layer (e.g. cathode material) showing spikes in atomic force microscopy covered with a smoothing layer reveals Kiessig fringes allowing the determination of the density of buried spikes. In general, it is shown that a smoothing layer on a rough surface enhances the sensitivity of x-ray reflectivity measurements.
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