In this study, resistance fluctuation or 1/ f noise was measured in thin films of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS). The 1/ f noise of thin films is much larger than what is typical uncooled type microbolometer sensing material such as vanadium oxide films and amorphous silicon films. To use PEDOT:PSS thin films for a bolometric application, the 1/ f noise should be reduced. This study discusses the effect of passivation for reducing the 1/ f noise.
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