Hirsch et al present an equation attributed to Presland and Pashley, which they infer can be employed to calculate the trace rotations of planar features during tilting. However, it is inapplicable due to the imperfection in theoretical consideration and it gives different results comparing to experiment as discussed in author’s paper.A new equation has been derived as shown in Figure 1. X and Y are the projectioas of tilt axes of double tilt stage on screen. OA is the intersection line of a planar feature intersecting with the foil surface, ψois the angle between OA and OX, it can be measured on screen (or on negatives) at foil normal orientation. To tilt a specimen to a new orientation [UVW] from [U0V0W0] , the tilt angle α and β can be calculated using the equations derived by the author’s, or read from the goniometer stage ia the light of diffractioa pattern. Suppose tilt the specimen around axis Y for β at first,the intersection line goes to OB, aad the trace on screen is OB’; then tilt the specimen around X for α, the spesimen attains its new orientation [UVW] and the intersection line goes to its final position OC. OD is the projection of OC, and the angle between OD and OX is ψ.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.