Software errors have been studied from various perspectives; however, most investigations have been limited to an individual section or a partial path of the cause-effect relationships of these errors. The bresent study analyzes approximately 700 errors in 4 commercial measuring-control software products, and then identifies the cause-effect relationships of errors occurring during software development. The analysis method used was: (i) defining appropriate observation points along the path leading from cause to effect of a software error, followed by gathering the corresponding data by analyzing each error using Fault Tree Analysis, and (ii) categorizing each observation point's data, and then summarizing the relationships between two adjoining points using a cross-indexing table. This paper presents four major cause-effect relationships and discusses the effects of the Structured Analysis and Structured Design methods on these relationships.
Among laboratory mistakes, "specimen mix-up" is the most frequent and the most serious. According to the Clinical Chemistry Laboratory Error Report of Toranomon Hospital, specimen mix-up was often detected when there were many large discrepancies between the results of a test and the results of a previous test. We present here a checking method to detect specimen mix-up. The method, which we call the "multivariate delta check" method, is an extension of the "delta check" method first presented by Nosanchuk and Gottmann (Am. J. Clin. Pathol. 62:707, 1974). Clinical evaluation has demonstrated the effectiveness of the method.
Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.
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