Recent advances in serial block-face imaging using scanning electron microscopy (SEM) have enabled the rapid and efficient acquisition of 3-dimensional (3D) ultrastructural information from a large volume of biological specimens including brain tissues. However, volume imaging under SEM is often hampered by sample charging, and typically requires specific sample preparation to reduce charging and increase image contrast. In the present study, we introduced carbon-based conductive resins for 3D analyses of subcellular ultrastructures, using serial block-face SEM (SBF-SEM) to image samples. Conductive resins were produced by adding the carbon black filler, Ketjen black, to resins commonly used for electron microscopic observations of biological specimens. Carbon black mostly localized around tissues and did not penetrate cells, whereas the conductive resins significantly reduced the charging of samples during SBF-SEM imaging. When serial images were acquired, embedding into the conductive resins improved the resolution of images by facilitating the successful cutting of samples in SBF-SEM. These results suggest that improving the conductivities of resins with a carbon black filler is a simple and useful option for reducing charging and enhancing the resolution of images obtained for volume imaging with SEM.

Polymer blends composed of multiple types of polymers are used for various industrial applications; therefore, their morphologies must be understood to predict and improve their physical properties. Herein, we propose a spectral imaging method based on scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy to map polymer morphologies with nanometric resolution as an alternative to the conventional electron staining technique. In particular, the low-loss spectra of the 5–30 eV energy-loss region were measured to minimize electron irradiation damage rather than the core-loss spectra, such as carbon K-shell absorption spectra, which require significantly longer recording times. Medium-voltage (200 kV) and high-voltage (1000 kV) STEM was used at various temperatures to compare the degrees of electron-beam damage resulting from various electron energies and sample temperatures. A multivariate curve resolution technique was used to isolate the constituent spectra and visualize their distributions by distinguishing the characteristic peaks derived from various chemical species. High-voltage STEM was more useful than medium-voltage STEM for analyzing thicker samples while suppressing ionization damage.