The semiconductor manufacturing processes have been evolved to improve the yield rate. Here, we studied a sequential and comprehensive algorithm that could be used for fault detection and classification (FDC) of the semiconductor chips. A statistical process control (SPC) method is employed for inspecting whether sensors used in the semiconductor manufacturing process become stable or not. When the sensors are individually stable, the algorithm conducts the relational inspection to identify the relationship between two sensors. The key factor here is the coefficient of determination (R2). If R2 is calculated as more than 0.7, their relationship is analyzed through the regression analysis, while the algorithm conducts the clustering analysis to the sensor pair with R2 less than 0.7. This analysis also provided the capability to determine whether the newly generated data are defective or defect-free. Therefore, this study is not only applied to the semiconductor manufacturing process but can also be to the various research fields where the big data are treated.
Microwell arrays are widely used for the analysis of fluorescent-labelled biomaterials. For rapid detection and automated analysis of microwell arrays, the computational image analysis is required. Support Vector Machines (SVM) can be used for this task. Here, we present a SVM-based approach for the analysis of microwell arrays consisting of three distinct steps: labeling, training for feature selection, and classification into three classes. The three classes are filled, partially filled, and unfilled microwells. Next, the partially filled wells are analyzed by SVM and their tendency towards filled or unfilled tested through applying a Gaussian filter. Through this, all microwells can be categorized as either filled or unfilled by our algorithm. Therefore, this SVM-based computational image analysis allows for an accurate and simple classification of microwell arrays.
The growing cognizance of spectrum scarcity has become a more significant concern in wireless radio communications. Due to the exponential growth of data transmission in intelligent wireless sensor networks, energy spectrum detection has become a promising solution for resolving spectrum shortages. Primary user emulation attack (PUEA) has been identified as a significant attack vector in the cognitive radio (CR) domain's physical layer. In comparison, the CR is a promising method to increase spectrum efficiency by allowing unlicensed secondary users (SUs) to access licensed frequency bands without interfering with approved primary users (PUs). The study's primary findings are the methodology for preventing PUEA using authentication tags, which are unique sequences. This research blends SC‐FDMA with CR to protect CR networks from PUEA attacks, a Latin square (LS) matrix tag generation system is proposed to mitigate the PUEA effect. The technology is meant to provide effective authentication and protection against malicious users. In a secured environment, the LS tag technique is utilized to track and estimate the PU. For example, the BER of both techniques is virtually identical between 0 and 4 dB, while the BER performance of the suggested LS tag generation improves with increasing signal‐to‐noise ratio (SNR). As a result, the suggested LS tag generation is less susceptible to PUEA. To diminish the influence of PUEA in CR networks, an efficient enlightening approach for making the future Green Cognitive Radio Wireless networks structure is proposed. The simulation results also demonstrate the resilience of the proposed CR spectrum sensing techniques for energy‐efficient knowledge at varying degrees to reduce the adverse effects of environmental technologies.
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