Editor's Note: Toolboxes are intended to briefly highlight and evaluate an emerging approach or a resource that is becoming widely used in neuroscience. For more information, see http://www.jneurosci.org/misc/itoa.shtml.

Articles you may be interested inMetrological large range scanning probe microscope Rev. Sci. Instrum. 75, 962 (2004); 10.1063/1.1651638 Tip characterization for scanning probe microscope width metrology AIP Conf.Dimensional measurement of surface topography with a probe microscope requires surface proximity sensing, probe position measurement, a probe with known shape, and careful analysis of the image generated. Our probe microscope contains some novel features. The proximity detector is a magnetically constrained rocking-beam force sensor stabilized with a capacitance-based force-balance system. This sensor accepts a wide range of probe tips, which are fabricated separately. The probes are either focused-ion-beam etched metal or chemically etched optical fibers. We show measurements of features arising from semiconductor manufacture.

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Articles you may be interested inSurface-mode enhanced photonic-crystal nano-imaging observed by a scanning near-field optical microscope