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A hybrid specification language µSZ, in which the dynamic behaviour of a system is described using Statecharts and the data and the data transformations are described using Z, has been developed for the specification of embedded systems. This paper describes an approach to testing from a deterministic sequential specification written in µSZ. By considering the Z specifications of the operations, the extended finite state machine (EFSM) defined by the Statechart can be rewritten to produce an EFSM that has a number of properties that simplify test generation. Test generation algorithms are introduced and applied to an example. While this paper considers µSZ specifications, the approaches described might be applied whenever the specification is an EFSM whose states and transitions are specified using a language similar to Z.

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